To address this challenge and enable manufacturers to quickly ramp capacity, Keysight has delivered the new P9002A parallel parametric test system, which offers cost-effective wafer test with high ...

This paper proposes a new nonparametric test for conditional parametric distribution functions based on the first-order linear expansion of the Kullback-Leibler information function and the kernel ...

As such, the test developed here is of fundamental importance to applied researchers using non-parametric methods for efficiency estimation. The test is shown to be consistent and its local power is ...